Kane, P. F. (1970). Characterization Of Semiconductor Materials. Taxes Instruments Incorporated.
Chicago Style (17th ed.) CitationKane, Philip F. Characterization Of Semiconductor Materials. United States Of America: Taxes Instruments Incorporated, 1970.
MLA (9th ed.) CitationKane, Philip F. Characterization Of Semiconductor Materials. Taxes Instruments Incorporated, 1970.
Warning: These citations may not always be 100% accurate.